AFM Probes » PPP-CONT

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Order Code Price
Quantity
PPP-CONT-10 Box of 10 AFM Probes
€276.00
PPP-CONT-50 Box of 50 AFM Probes
€1 091.00
You save 289.00 EUR or 20.90% with this box
PPP-CONT-W Box of 380 AFM Probes
€5 525.00
You save 4963.00 EUR or 47.30% with this box

PPP-CONT

Standard Contact Mode AFM Probe

Coating: None
Tip shape: Standard
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

The new PointProbe®Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS PPP-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The probe offers unique features:

  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 450 µm (440 - 460 µm)*
  • 50 µm (42.5 - 57.5 µm)*
  • 2 µm (1 - 3 µm)*
  • 0.2 N/m (0.02 - 0.77 N/m)*
  • 13 kHz (6 - 21 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

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