AFM Probes » PPP-MFMR

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Quantity
PPP-MFMR-10 Box of 10 AFM Probes
€596.00
PPP-MFMR-20 Box of 20 AFM Probes
€1 067.00
You save 125.00 EUR or 10.50% with this box
PPP-MFMR-50 Box of 50 AFM Probes
€2 352.00
You save 628.00 EUR or 21.10% with this box
PPP-MFMR-W Box of 380 AFM Probes
€11 603.00
You save 11045.00 EUR or 48.80% with this box

PPP-MFMR

Hard Magnetic, Medium Momentum AFM Probe

Coating: Magnetic
Tip shape: Standard
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values
The NANOSENSORS™ PPP-MFMR AFM probe is our standard probe for magnetic force microscopy providing a reasonable sensitivity, resolution and coercitivity. It has proven stable imaging of a variety of recording media and other samples. The force constant of this probe type is specially tailored for magnetic force microscopy yielding high force sensitivity while simultaneously enabling tapping mode and lift mode operation.
 
The SPM probe offers unique features:

  • hard magnetic coating on the tip side (coercivity of app. 300 Oe, remanence magnetization of app. 300 emu/cm3)
  • effective magnetic moment in the order of 10^-13 emu
  • metallic electrical conductivity
  • excellent tip radius of curvature
  • magnetic resolution better than 50 nm
  • Al coating on detector side of cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series


As both coatings are almost stress free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.

The hardmagnetic coating on the tip is optimized for high magnetic contrast and high lateral resolution of considerably better than 50 nm. The coating is characterized by a coercivity of app. 300 Oe and a remanence magnetization of app. 300 emu/cm3 (these values were determined on a flat surface).

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (215 - 235 µm)*
  • 28 µm (20 - 35 µm)*
  • 3 µm (2 - 4 µm)*
  • 2.8 N/m (0.5 - 9.5 N/m)*
  • 75 kHz (45 - 115 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

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