AFM Probes » PPP-SEIH

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Order Code Price
Quantity
PPP-SEIH-10 Box of 10 AFM Probes
€276.00
PPP-SEIH-50 Box of 50 AFM Probes
€1 091.00
You save 289.00 EUR or 20.90% with this box
PPP-SEIH-W Box of 380 AFM Probes
€5 525.00
You save 4963.00 EUR or 47.30% with this box

PPP-SEIH

Special Tapping Mode AFM Probe

Coating: None
Tip shape: Standard
Cantilever:
F 130 kHz
C 15 N/m
L 225 µm
*nominal values

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORSPPP-SEIH AFM probes (Seiko Instruments / high force constant).

The probe offers unique features:

  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (215 - 235 µm)*
  • 33 µm (25 - 40 µm)*
  • 5 µm (4 - 6 µm)*
  • 15 N/m (5 - 37 N/m)*
  • 130 kHz (96 - 175 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

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