-auto-alignment probes for N
ontact / Tapping mode application (H
igh resonance frequency) with a R
eflex coating extend the plug-and-fit alignment concept of the Align
ment Chip (ALIGN) to 125 µm short cantilevers optimized for high speed non-contact / tapping mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8µm is possible for all probes of the XY-alignment probes series – independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225µm.
As a matter of course, the features of the proven P
lus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.NANOSENSORS™ PPP-NCHR
AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped silicon to dissipate static charge
- Al coating on detector side of cantilever
- chemically inert
- high mechanical Q-factor for high sensitivity
- tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)