This competitively priced silicon nitride AFM probe features:
- 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants
- silicon nitride wedge tip
- overall tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
- macroscopic half cone angle of 35°
Consistent high quality at a lower price!
Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors SiNi AFM probe.