The SC-35-LM is a low moment probe designed for the imaging of soft magnetic samples and other applications that required a reduced tip field. By the use of Side Coating in combination with a low magnetization coating, the tip field is low and confined to the tip apex. The SC-35-LM is the ideal probe to study domain patterns in soft magnetic media while maintaining good topographic resolution.
Tip radius < 40 nm
This product features alignment grooves on the back side of the holder chip.