AFM Probes » SSS-FM

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Order Code Price
Quantity
SSS-FM-10 Box of 10 AFM Probes
€653.00
SSS-FM-20 Box of 20 AFM Probes
€1 169.00
You save 137.00 EUR or 10.50% with this box
SSS-FM-50 Box of 50 AFM Probes
€2 576.00
You save 689.00 EUR or 21.10% with this box
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ESD Kit recommended with this product. Click here to order: ESD Kit

SSS-FM

SuperSharp, Force Modulation AFM Probe

Coating: None
Tip shape: Supersharp
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

NANOSENSORSSSS-FM AFM probes are designed for force modulation mode.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FM tip serves also as a basis for high resolution tips with magnetic coatings SSS-MFMR. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

The probe offers unique features:

  • excellent tip radius of curvature
  • typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • monolithic material
  • highly doped to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity
Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (215 - 235 µm)*
  • 30 µm (20 - 35 µm)*
  • 3 µm (2 - 4 µm)*
  • 2.8 N/m (0.5 - 9.5 N/m)*
  • 75 kHz (45 - 115 kHz)*
  • * guaranteed range

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