This competitively priced silicon nitride AFM probe features:
- 2 silicon nitride cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip
- silicon nitride wedge tip
- overall tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm
- macroscopic half cone angle of 35°
Consistent high quality at a lower price!