AFM Probes » XNC12/Cr-Au

 Order  Request a quote (RFQ)
Order Code Price
Quantity
XNC12/Cr-Au-10 Box of 10 AFM Probes
€279.00
XNC12/Cr-Au-35 Box of 35 AFM Probes
€795.00
You save 181.50 EUR or 18.60% with this box
XNC12/Cr-Au-70 Box of 70 AFM Probes
€1 400.00
You save 553.00 EUR or 28.30% with this box

XNC12/Cr-Au

AFM Probe with 2 Different Gold Coated Silicon Nitride Cantilevers on Each Side of the Chip

Coating: Gold Overall
Tip shape: Pyramid
This probe features 4 cantilevers
F 17 kHz
C 0.08 N/m
L 200 µm
F 67 kHz
C 0.32 N/m
L 100 µm
*nominal values

Probes of the 12 series have 2 silicon nitride cantilevers and tips on each side of the glass holder chip. They are used for soft contact mode applications.

Probes with a conductive, chemically inert 35 nm Cr-Au coating on the tip side of the cantilever and 70 nm Cr-Au coating on the back side of the cantilever. Resulting tip radius is about 30 nm. The coating may cause cantilever bending within 2°.

Cr-Au coating is formed as an Au film on a Cr sublayer, which is deposited for better adhesion of Au. The coating thickness is 70 nm on the backside of the cantilever and 35 nm on the tipside of the cantilever.

AFM Tip:

  • Pyramid
  • 3.5 µm
  • < 10 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Triangle
  • 200 µm (190 - 210 µm)*
  • 28 µm (23 - 33 µm)*
  • 500 nm
  • 0.08 N/m
  • 17 kHz
  • Cantilever B
  • Triangle
  • 100 µm (90 - 110 µm)*
  • 13.5 µm (8.5 - 18.5 µm)*
  • 500 nm
  • 0.32 N/m
  • 67 kHz
  • * typical range

    Give us your feedback

    Did we miss any relevant information of this product?
    Did you find this or a comparable product for a better price?