AFM Probes » HQ:CSC37/tipless/Al BS

HQ:CSC37/tipless/Al BS

Tipless AFM Probe with 3 Different Contact Mode Cantilevers

Coating: Reflex Aluminum
Tip shape: Tipless
This probe features 3 cantilevers
F 40 kHz
C 0.8 N/m
L 250 µm
F 20 kHz
C 0.3 N/m
L 350 µm
F 30 kHz
C 0.4 N/m
L 300 µm
*nominal values
Probes of the 37/tipless series have three different tipless contact mode cantilevers on one side of the holder chip. They can be used in various applications.
Backside Al coated. Coating thickness - 30 nm.

AFM Tip:

  • Tipless
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 250 µm
  • 35 µm
  • 2 µm
  • 0.8 N/m (0.3 - 2 N/m)*
  • 40 kHz (30 - 55 kHz)*
  • Cantilever B
  • Beam
  • 350 µm
  • 35 µm
  • 2 µm
  • 0.3 N/m (0.1 - 0.6 N/m)*
  • 20 kHz (15 - 30 kHz)*
  • Cantilever C
  • Beam
  • 300 µm
  • 35 µm
  • 2 µm
  • 0.4 N/m (0.1 - 1 N/m)*
  • 30 kHz (20 - 40 kHz)*
  • * typical range

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