AFM Probes » HQ:CSC38/tipless/Al BS

HQ:CSC38/tipless/Al BS

Tipless AFM Probe with 3 Different Contact Mode Cantilevers

Coating: Reflex Aluminum
Tip shape: Tipless
This probe features 3 cantilevers
F 20 kHz
C 0.09 N/m
L 250 µm
F 10 kHz
C 0.03 N/m
L 350 µm
F 14 kHz
C 0.05 N/m
L 300 µm
*nominal values
Probes of the 38/tipless series have three different tipless contact mode cantilevers on one side of the holder chip. They can be used in various applications.
Backside Al coated. Coating thickness - 30 nm.

AFM Tip:

  • Tipless
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 250 µm
  • 32.5 µm
  • 1 µm
  • 0.09 N/m (0.01 - 0.36 N/m)*
  • 20 kHz (8 - 32 kHz)*
  • Cantilever B
  • Beam
  • 350 µm
  • 32.5 µm
  • 1 µm
  • 0.03 N/m (0.003 - 0.13 N/m)*
  • 10 kHz (5 - 17 kHz)*
  • Cantilever C
  • Beam
  • 300 µm
  • 32.5 µm
  • 1 µm
  • 0.05 N/m (0.005 - 0.21 N/m)*
  • 14 kHz (6 - 23 kHz)*
  • * typical range

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