AFM Probes » HiRes-C18/Cr-Au

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HiRes-C18/Cr-Au-5 Box of 5 AFM Probes
€400.00
esd kit

ESD Kit recommended with this product. Click here to order: ESD Kit

HiRes-C18/Cr-Au

High Resolution, Soft Tapping Mode AFM Probe

Coating: Reflex Gold
Tip shape: Supersharp
This probe features 4 cantilevers
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values
Cantilevers of the 18 series are optimal for the Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in Force modulation mode and the true topography imaging of the soft samples.

High-resolution probe with a hydrophobic diamond-like extratip at the apex of the silicon etched probe.
Cr-Au coating on both sides of the cantilever. The coating does not cover the extratip!

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm
  • 27.5 µm
  • 3 µm
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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