AFM Probes » HQ:CSC17/Al BS

HQ:CSC17/Al BS

Standard Contact Mode AFM Probe

Coating: None
Tip shape: Rotated
Cantilever:
F 13 kHz
C 0.18 N/m
L 450 µm
*nominal values
Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.
Backside Al coated. Coating thickness - 30 nm.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 450 µm
  • 50 µm
  • 2 µm
  • 0.18 N/m (0.06 - 0.4 N/m)*
  • 13 kHz (10 - 17 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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