AFM Probes » HQ:DPER-XSC11

HQ:DPER-XSC11

AFM Probe with 4 Different Electrical Cantilevers

Coating: Electrically Conductive
Tip shape: Rotated
This probe features 4 cantilevers
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
*nominal values
Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.

The DPER probes are made by depositing a thin metal coating on Si tips. The thickness of the coating on the flat cantilever surface is about 15 nm, resulting in a coated tip radius below 20 nm. The probes can be used for imaging samples with higher resolution in XY directions.
The DPER probes are made by depositing a thin Pt coating on both sides of the Si cantilevers. The thickness of the coating on the flat cantilever surface is about 15 nm.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 20 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 500 µm
  • 30 µm
  • 2.7 µm
  • 0.2 N/m (0.1 - 0.4 N/m)*
  • 15 kHz (12 - 18 kHz)*
  • Cantilever B
  • Beam
  • 210 µm
  • 30 µm
  • 2.7 µm
  • 2.7 N/m (1.1 - 5.6 N/m)*
  • 80 kHz (60 - 100 kHz)*
  • Cantilever C
  • Beam
  • 150 µm
  • 30 µm
  • 2.7 µm
  • 7 N/m (3 - 16 N/m)*
  • 155 kHz (115 - 200 kHz)*
  • Cantilever D
  • Beam
  • 100 µm
  • 50 µm
  • 2.7 µm
  • 42 N/m (17 - 90 N/m)*
  • 350 kHz (250 - 465 kHz)*
  • * typical range

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