AFM Probes » HQ:NSC14/Hard/Al BS

HQ:NSC14/Hard/Al BS

Long Scanning, DLC Hardened, Soft Tapping Mode AFM Probe

Coating: Hard Diamond-Like-Carbon
Tip shape: Rotated
Cantilever:
F 160 kHz
C 5 N/m
L 125 µm
*nominal values
Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.
Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm
  • 25 µm
  • 2.1 µm
  • 5 N/m (1.8 - 13 N/m)*
  • 160 kHz (110 - 220 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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