AFM Probes » HQ:NSC14/No Al

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HQ:NSC14/No Al-15 Box of 15 AFM Probes
HQ:NSC14/No Al-50 Box of 50 AFM Probes
You save 150.00 EUR or 15.00% with this box
HQ:NSC14/No Al-100 Box of 100 AFM Probes
€1 530.00
You save 470.00 EUR or 23.50% with this box
HQ:NSC14/No Al-200 Box of 200 AFM Probes
€2 720.00
You save 1280.00 EUR or 32.00% with this box
HQ:NSC14/No Al-400 Box of 400 AFM Probes
€4 080.00
You save 3920.00 EUR or 49.00% with this box

HQ:NSC14/No Al

Soft Tapping Mode AFM Probe

Coating: None
Tip shape: Rotated
F 160 kHz
C 5 N/m
L 125 µm
*nominal values
Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm
  • 25 µm
  • 2.1 µm
  • 5 N/m (1.8 - 13 N/m)*
  • 160 kHz (110 - 220 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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