AFM Probes » HQ:NSC16/Hard/Al BS

HQ:NSC16/Hard/Al BS

Long Scanning, DLC Hardened Tapping Mode AFM Probe with Long Cantilever

Coating: Hard Diamond-Like-Carbon
Tip shape: Rotated
Cantilever:
F 190 kHz
C 45 N/m
L 225 µm
*nominal values
These cantilevers with the high spring constant and the low resonant frequency (below 250 kHz) can be used in Tapping mode in SPM that has a low-frequency feedback loop. These cantilevers also fit SPM systems that do not support probes with short lever arms.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.
Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm
  • 37.5 µm
  • 7 µm
  • 45 N/m (30 - 70 N/m)*
  • 190 kHz (170 - 210 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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