AFM Probes » HQ:NSC19/No Al

HQ:NSC19/No Al

Standard Force Modulation AFM Probe

Coating: None
Tip shape: Rotated
Cantilever:
F 65 kHz
C 0.5 N/m
L 125 µm
*nominal values
Cantilevers of the 19 series combine the high frequency and low spring constant, which makes them applicable to imaging soft and fragile surfaces at a relatively high speed in Tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™**. The cantilevers may also be useful in LFM due to the high sensitivity to the lateral forces.
Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm
  • 22.5 µm
  • 1 µm
  • 0.5 N/m (0.05 - 2.3 N/m)*
  • 65 kHz (25 - 120 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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