AFM Probes » HQ:NSC35/Al BS

HQ:NSC35/Al BS

AFM Probe with 3 Different Tapping Mode Cantilevers

Coating: Reflex Aluminum
Tip shape: Rotated
This probe features 3 cantilevers
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
*nominal values
Probes of the 35 series have three different tapping mode cantilevers on one side of the holder chip. They can be used in various applications.
Backside Al coated. Coating thickness - 30 nm.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 8 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 110 µm
  • 35 µm
  • 2 µm
  • 8.9 N/m (2.7 - 24 N/m)*
  • 205 kHz (130 - 290 kHz)*
  • Cantilever B
  • Beam
  • 90 µm
  • 35 µm
  • 2 µm
  • 16 N/m (4.8 - 44 N/m)*
  • 300 kHz (185 - 430 kHz)*
  • Cantilever C
  • Beam
  • 130 µm
  • 35 µm
  • 2 µm
  • 5.4 N/m (1.7 - 14 N/m)*
  • 150 kHz (95 - 205 kHz)*
  • * typical range

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