AFM Probes » HQ:NSC35/Cr-Au

HQ:NSC35/Cr-Au

AFM Probe with 3 Different Gold Coated Tapping Mode Cantilevers

Coating: Gold Overall
Tip shape: Rotated
This probe features 3 cantilevers
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
*nominal values
Probes of the 35 series have three different tapping mode cantilevers on one side of the holder chip. They can be used in various applications.

Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°.
Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tipside and backside of the cantilever.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 35 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 110 µm
  • 35 µm
  • 2 µm
  • 8.9 N/m (2.7 - 24 N/m)*
  • 205 kHz (130 - 290 kHz)*
  • Cantilever B
  • Beam
  • 90 µm
  • 35 µm
  • 2 µm
  • 16 N/m (4.8 - 44 N/m)*
  • 300 kHz (185 - 430 kHz)*
  • Cantilever C
  • Beam
  • 130 µm
  • 35 µm
  • 2 µm
  • 5.4 N/m (1.7 - 14 N/m)*
  • 150 kHz (95 - 205 kHz)*
  • * typical range

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