AFM Probes » HQ:NSC35/Pt

HQ:NSC35/Pt

AFM Probe with 3 Different Electrical, Tapping Mode Cantilevers

Coating: Electrically Conductive
Tip shape: Rotated
This probe features 3 cantilevers
F 205 kHz
C 8.9 N/m
L 110 µm
F 300 kHz
C 16 N/m
L 90 µm
F 150 kHz
C 5.4 N/m
L 130 µm
*nominal values
Probes of the 35 series have three different tapping mode cantilevers on one side of the holder chip. They are suitable for different electrical measurements.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.
The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 30 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 110 µm
  • 35 µm
  • 2 µm
  • 8.9 N/m (2.7 - 24 N/m)*
  • 205 kHz (130 - 290 kHz)*
  • Cantilever B
  • Beam
  • 90 µm
  • 35 µm
  • 2 µm
  • 16 N/m (4.8 - 44 N/m)*
  • 300 kHz (185 - 430 kHz)*
  • Cantilever C
  • Beam
  • 130 µm
  • 35 µm
  • 2 µm
  • 5.4 N/m (1.7 - 14 N/m)*
  • 150 kHz (95 - 205 kHz)*
  • * typical range

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