AFM Probes » HQ:NSC36/No Al

HQ:NSC36/No Al

AFM Probe with 3 Different Force Modulation Mode Cantilevers

Coating: None
Tip shape: Rotated
This probe features 3 cantilevers
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
*nominal values
Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip. They can be used in various applications.
Uncoated

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 8 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 110 µm
  • 32.5 µm
  • 1 µm
  • 1 N/m (0.1 - 4.6 N/m)*
  • 90 kHz (30 - 160 kHz)*
  • Cantilever B
  • Beam
  • 90 µm
  • 32.5 µm
  • 1 µm
  • 2 N/m (0.2 - 9 N/m)*
  • 130 kHz (45 - 240 kHz)*
  • Cantilever C
  • Beam
  • 130 µm
  • 32.5 µm
  • 1 µm
  • 0.6 N/m (0.06 - 2.7 N/m)*
  • 65 kHz (25 - 115 kHz)*
  • * typical range

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