AFM Probes » HQ:NSC36/Pt

HQ:NSC36/Pt

AFM Probe with 3 Different Electrical, Force Modulation Mode Cantilevers

Coating: Electrically Conductive
Tip shape: Rotated
This probe features 3 cantilevers
F 90 kHz
C 1 N/m
L 110 µm
F 130 kHz
C 2 N/m
L 90 µm
F 65 kHz
C 0.6 N/m
L 130 µm
*nominal values
Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip. They are suitable for different electrical measurements.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.
The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 30 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 110 µm
  • 32.5 µm
  • 1 µm
  • 1 N/m (0.1 - 4.6 N/m)*
  • 90 kHz (30 - 160 kHz)*
  • Cantilever B
  • Beam
  • 90 µm
  • 32.5 µm
  • 1 µm
  • 2 N/m (0.2 - 9 N/m)*
  • 130 kHz (45 - 240 kHz)*
  • Cantilever C
  • Beam
  • 130 µm
  • 32.5 µm
  • 1 µm
  • 0.6 N/m (0.06 - 2.7 N/m)*
  • 65 kHz (25 - 115 kHz)*
  • * typical range

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