AFM Probes » HQ:XSC11/Pt

HQ:XSC11/Pt

AFM Probe with 4 Different Electrical Cantilevers

Coating: Electrically Conductive
Tip shape: Rotated
This probe features 4 cantilevers
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
*nominal values
Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.
The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 30 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 500 µm
  • 30 µm
  • 2.7 µm
  • 0.2 N/m (0.1 - 0.4 N/m)*
  • 15 kHz (12 - 18 kHz)*
  • Cantilever B
  • Beam
  • 210 µm
  • 30 µm
  • 2.7 µm
  • 2.7 N/m (1.1 - 5.6 N/m)*
  • 80 kHz (60 - 100 kHz)*
  • Cantilever C
  • Beam
  • 150 µm
  • 30 µm
  • 2.7 µm
  • 7 N/m (3 - 16 N/m)*
  • 155 kHz (115 - 200 kHz)*
  • Cantilever D
  • Beam
  • 100 µm
  • 50 µm
  • 2.7 µm
  • 42 N/m (17 - 90 N/m)*
  • 350 kHz (250 - 465 kHz)*
  • * typical range

    Give us your feedback

    Did we miss any relevant information of this product?
    Did you find this or a comparable product for a better price?