AFM Probes » 240AC-NA

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Order Code Price
Quantity
240AC-NA-10 Box of 10 AFM Probes
€200.00
240AC-NA-24 Box of 24 AFM Probes
€440.00
You save 40.00 EUR or 8.30% with this box
240AC-NA-50 Box of 50 AFM Probes
€850.00
You save 150.00 EUR or 15.00% with this box
240AC-NA-100 Box of 100 AFM Probes
€1 530.00
You save 470.00 EUR or 23.50% with this box

240AC-NA

Force Modulation AFM Probe with Tip at the Very End of the Cantilever

Coating: Reflex Aluminum
Tip shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
*nominal values
The 240AC series is designed for AC mode AFM imaging of soft samples. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
30 nm Al on the back side of the cantilever

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm (2.1 - 3.1 µm)*
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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