AFM Probes » 240AC-PP

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Order Code Price
Quantity
240AC-PP-10 Box of 10 AFM Probes
€250.00
240AC-PP-24 Box of 24 AFM Probes
€575.00
You save 25.00 EUR or 4.20% with this box
240AC-PP-50 Box of 50 AFM Probes
€1 050.00
You save 200.00 EUR or 16.00% with this box
240AC-PP-100 Box of 100 AFM Probes
€1 800.00
You save 700.00 EUR or 28.00% with this box

240AC-PP

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever

Coating: Electrically Conductive
Tip shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
*nominal values
The 240AC-PP is designed for AC mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc. The overall platinum coating ensures high electrical conductivity and significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
25 nm Pt on both sides of the cantilever

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 240 µm (230 - 250 µm)*
  • 40 µm (38 - 42 µm)*
  • 2.6 µm (2.1 - 3.1 µm)*
  • 2 N/m (0.6 - 3.9 N/m)*
  • 70 kHz (45 - 90 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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