AFM Probes » 55AC-NA

 Order  Request a quote (RFQ)
Order Code Price
55AC-NA-5 Box of 5 AFM Probes
55AC-NA-24 Box of 24 AFM Probes
You save 133.00 EUR or 11.80% with this box
55AC-NA-50 Box of 50 AFM Probes
€1 955.00
You save 395.00 EUR or 16.80% with this box
55AC-NA-100 Box of 100 AFM Probes
€3 795.00
You save 905.00 EUR or 19.30% with this box
Product availability: On stock


Ultra High Frequency AFM Probe with Tip at the Very End of the Cantilever

Coating: Reflex Aluminum
Tip shape: OPUS
F 1.2 MHz
C 100 N/m
L 65 µm
*nominal values
The 55AC series is designed for high speed AC mode imaging. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of  the cantilever. This allows the tip to be positioned accurately over the are of interest on the sample surface.
30 nm Al on the back side of the cantilever

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 100 N/m (35 - 215 N/m)*
  • 1200 kHz (650 - 1850 kHz)*
  • 65 µm (55 - 75 µm)*
  • 31 µm (29 - 33 µm)*
  • 3 µm (2.5 - 3.5 µm)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

    Give us your feedback

    Did we miss any relevant information of this product?
    Did you find this or a comparable product for a better price?