Plateau AFM Tips

PL2-CONT

Contact Mode AFM Probe with Plateau Tip

Coating: none
Tip Shape: Plateau

Cantilever:

F 13 kHz

C 0.2 N/m

L 450 µm

PL2-CONTR

Contact Mode AFM Probe with Plateau Tip

Coating: Reflex Aluminum
Tip Shape: Plateau

Cantilever:

F 13 kHz

C 0.2 N/m

L 450 µm

PL2-FM

Force Modulation AFM Probe with Plateau Tip

Coating: none
Tip Shape: Plateau

Cantilever:

F 75 kHz

C 2.8 N/m

L 225 µm

PL2-FMR

Force Modulation AFM Probe with Plateau Tip

Coating: Reflex Aluminum
Tip Shape: Plateau

Cantilever:

F 75 kHz

C 2.8 N/m

L 225 µm

PL2-NCH

Tapping Mode AFM Probe with Plateau Tip

Coating: none
Tip Shape: Plateau

Cantilever:

F 330 kHz

C 42 N/m

L 125 µm

Special Developments

Not available in the standard scope of products

Coating: various
Tip Shape: various

PL2-NCHR

Tapping Mode AFM Probe with Plateau Tip

Coating: Reflex Aluminum
Tip Shape: Plateau

Cantilever:

F 330 kHz

C 42 N/m

L 125 µm

PL2-NCL

Tapping Mode AFM Probe with Long Cantilever and Plateau Tip

Coating: none
Tip Shape: Plateau

Cantilever:

F 190 kHz

C 48 N/m

L 225 µm

PL2-NCLR

Tapping Mode AFM Probe with Long Cantilever and Plateau Tip

Coating: Reflex Aluminum
Tip Shape: Plateau

Cantilever:

F 190 kHz

C 48 N/m

L 225 µm