AFM Probes » AR5-NCH

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Order Code Price
Quantity
AR5-NCH-10 Box of 10 AFM Probes
$889.00
AR5-NCH-20 Box of 20 AFM Probes
$1 590.00
You save 188.00 USD or 10.60% with this box
AR5-NCH-50 Box of 50 AFM Probes
$3 508.00
You save 937.00 USD or 21.10% with this box
AR5-NCH-W Box of 370 AFM Probes
$17 304.00
You save 15589.00 USD or 47.40% with this box
esd kit

ESD Kit recommended with this product. Click here to order: ESD Kit

AR5-NCH

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: None
Tip shape: High-Aspect-Ratio
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
*nominal values

NANOSENSORS™ AR5-NCH AFM tips are designed for non-contact mode or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.

The probe offers unique features:

  • length of the high aspect ratio portion of the tip > 2 µm
  • typical aspect ratio at 2 µm in the order of 7:1 (when viewed from side as well as along cantilever axis)
  • excellent tip radius of curvature
  • monolithic tip
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity
Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm (115 - 135 µm)*
  • 30 µm (30 - 45 µm)*
  • 4 µm (3 - 5 µm)*
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

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