AFM Probes » All-In-One-DD

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Order Code Price
Quantity
AIO-DD-5 Box of 5 AFM Probes
$730.00
AIO-DD-10 Box of 10 AFM Probes
$1 165.00
You save 295.00 USD or 20.20% with this box
AIO-DD-20 Box of 20 AFM Probes
$1 995.00
You save 925.00 USD or 31.70% with this box
AIO-DD-50 Box of 50 AFM Probes
$4 970.00
You save 2330.00 USD or 31.90% with this box

All-In-One-DD

Diamond Coated, Conductive AFM Probe with 4 Different Cantilevers

Coating: Conductive Diamond
Tip shape: Array
This probe features 4 cantilevers
F 19 kHz
C 0.5 N/m
L 500 µm
F 110 kHz
C 6.5 N/m
L 210 µm
F 200 kHz
C 18 N/m
L 150 µm
F 450 kHz
C 100 N/m
L 100 µm
*nominal values

Versatile monolithic silicon AFM probe with 4 different cantilevers on a single AFM holder chip for various applications: nanoindentation, nanolithography and electric modes such as: 

 

  • scanning capacitance microscopy (SCM)
  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KFM)
  • conductive atomic force microscopy (C-AFM).

 

The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.

The doped polycristalline diamond tip coating provides unprecedented hardness and durability, as well as electridcal conductivity for demanding electrical applications. The resulting tip radius is in the range 100-300nm.

The rotated tips allow for more symmetric representation of high sample features.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with: Bruker / Veeco / Digital Instruments, Keysight / Agilent / Molecular Imaging, Asylum Research, Park Systems, JEOL, etc.

The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose the right cantilever for each application in the very last moment. You do not need to stock various AFM probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of the comparable specialized single-cantilever AFM probes.

Please note that the aluminum back side coating is not suitable for measurements in liquids!

Consistent high quality at a lower price!

Boron doped polycrystalline diamond tip coating, 100 nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick.

AFM Tip:

  • Rotated
  • 17 µm (15 - 19 µm)*
  • 15 µm (10 - 20 µm)*
  • 20°-25° front view, 25°-30° from side, 10° at the apex
  • AFM Cantilevers:

    Cantilever A - Contact Mode
  • Beam
  • 500 µm (490 - 510 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • 0.5 N/m (0.2 - 0.9 N/m)*
  • 19 kHz (16 - 24 kHz)*
  • Cantilever B - Force Modulation
  • Beam
  • 210 µm (200 - 220 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • 6.5 N/m (3 - 12 N/m)*
  • 110 kHz (80 - 140 kHz)*
  • Cantilever C - Soft Tapping
  • Beam
  • 150 µm (140 - 160 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • 18 N/m (8 - 35 N/m)*
  • 200 kHz (140 - 260 kHz)*
  • Cantilever D - Tapping Mode
  • Beam
  • 100 µm (90 - 110 µm)*
  • 50 µm (45 - 55 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • 100 N/m (48 - 190 N/m)*
  • 450 kHz (230 - 600 kHz)*
  • * typical range

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