AFM Probes » All-In-One-DLC

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AIODLC-10 Box of 10 AFM Probes
$240.00

All-In-One-DLC

Diamond-Like-Carbon Coated AFM Probe with 4 Different Cantilevers for Various Applications

Coating: Hard Diamond-Like-Carbon
Tip shape: Rotated
This probe features 4 cantilevers
F 15 kHz
C 0.2 µm
L 500 µm
F 80 kHz
C 2.7 N/m
L 200 µm
F 150 kHz
C 7.4 N/m
L 150 µm
F 350 kHz
C 40 N/m
L 100 µm
*nominal values

Versatile silicon AFM probe with 4 different cantilevers on a single AFM holder chip. Rotated, monolithic silicon AFM probe with symmetric tip shape for various applications (contact mode, force modulation mode, tapping mode and soft tapping mode). The short cantilever end is marked by a trapezoidal pattern visible with bare eyes.

High durability and hydrophobicity due to Diamond-Like-Carbon coating on tip side of the cantilever.

The rotated tips allow for more symmetric representation of high sample features. The consistent tip radii ensure good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:

  • Bruker / Veeco / Digital Instruments
  • Keysight / Agilent / Molecular Imaging
  • Asylum Research
  • Park Systems
  • JEOL
  • JPK
  • etc.

The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right cantilever for each application. You don't need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.

Please note that the aluminum back side coating is not suitable for measurements in liquids!

Consistent high quality at a lower price!

Diamond-Like-Carbon coating on tip side of the cantilever, 15 nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick

AFM Tip:

  • Rotated
  • 17 µN/m (15 - 19 µN/m)*
  • 15 µm (10 - 20 µm)*
  • < 15 nm
  • 20°-25° front view, 25°-30° from side, 10° at the apex
  • AFM Cantilevers:

    Cantilever A - Contact Mode
  • Beam
  • 0.2 µm (0.04 - 0.7 µm)*
  • 15 µm (10 - 20 µm)*
  • 500 µm (490 - 510 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • Cantilever B - Force Modulation
  • Beam
  • 2.7 N/m (0.4 - 10 N/m)*
  • 80 kHz (50 - 110 kHz)*
  • 200 µm (200 - 220 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • Cantilever C - Soft Tapping
  • Beam
  • 7.4 N/m (1 - 29 N/m)*
  • 150 kHz (70 - 230 kHz)*
  • 150 µm (140 - 160 µm)*
  • 30 µm (25 - 35 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • Cantilever D - Tapping Mode
  • Beam
  • 40 N/m (7 - 160 N/m)*
  • 350 kHz (200 - 500 kHz)*
  • 100 µm (90 - 110 µm)*
  • 50 µm (45 - 55 µm)*
  • 2.7 µm (1.7 - 3.7 µm)*
  • * typical range

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