AFM Probes » CDT-NCLR

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Quantity
CDT-NCLR-10 Box of 10 AFM Probes
$1 481.00
CDT-NCLR-20 Box of 20 AFM Probes
$2 650.00
You save 312.00 USD or 10.50% with this box
CDT-NCLR-50 Box of 50 AFM Probes
$5 846.00
You save 1559.00 USD or 21.10% with this box

CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever

Coating: Diamond,
Conductive Diamond
Tip shape: Standard
Cantilever:
F 210 kHz
C 72 N/m
L 225 µm
*nominal values

NANOSENSORS™ CDT-NCLR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to the NANOSENSORS™ high frequency non-contact type (NCH). The CDT-NCLR probe is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

The probe offers unique features:
  • real diamond coating, highly doped
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

 

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (215 - 235 µm)*
  • 37.5 µm (30 - 45 µm)*
  • 7 µm (6 - 8 µm)*
  • 72 N/m (34 - 142 N/m)*
  • 210 kHz (155 - 275 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

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