AFM Probes » CP-qp-SCONT-SiO

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Order Code Price
Quantity
CP-qp-SCONT-SiO-A-5 Box of 5 AFM Probes
sphere Ø = 2 µm
$550.00
CP-qp-SCONT-SiO-B-5 Box of 5 AFM Probes
sphere Ø = 3.5 µm
$550.00
CP-qp-SCONT-SiO-C-5 Box of 5 AFM Probes
sphere Ø = 6.62 µm
$550.00
Product availability: made-to-order, ~3 weeks delivery

CP-qp-SCONT-SiO

Colloidal probe, AFM cantilever with round tip like a ball

Coating: Reflex Chromium/Gold
Tip shape: Sphere
Cantilever:
F 11 kHz
C 0.01 N/m
L 125 µm
*nominal values

The new sQube® colloidal probe combines the well-known features of the proven qp-SCONT probes series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp tip. The excellent radius and the minimized variation of diameter provide reproducible signals.

qp-SCONT AFM probes are designed for contact mode AFM imaging in air or for applications in liquid environments with a reduced thermal drift. The SCONT type is also optimized for high sensitivity due to a low force constant.

The so called "Colloidal Probe Technique", where single colloids are attached to AFM cantilevers for force measurements, opens the chance for a better understanding of fundamental interactions in a variety of fields.

Examples are adhesion phenomena, particle-surface-interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications.

The probe offers unique features:

        - sphere material: silicon dioxide (SiO2)

        - excellent sphere diameter: A = 2 µm, B = 3.5 µm or C = 6.62 µm (all +/- 5%) 

       (Due to different masses the resonance frequency can differ.)

       Please choose A, B or C when ordering!

A chromium/gold layer of about 60nm is partially coating the cantilever on the detector side near its free end where the tip is situated. The main advantages of this partial metallic coating are considerably less cantilever bending and reduced drift for SPM measurements in liquid environments.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 0.01 N/m (0.006 - 0.015 N/m)*
  • 11 kHz (8 - 13 kHz)*
  • 125 µm (120 - 130 µm)*
  • 34 µm (32 - 36 µm)*
  • 350 nm (320 - 380 nm)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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