AFM Probes » M-CNT-500

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NT_CNT500_v0010-5 Box of 5 AFM Probes
$3 000.00
esd kit

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M-CNT-500

Tilt compensated, amorphous EBD CNT for depth control measurements

Coating: Reflex Aluminum
Tip shape: EBD, Cylindrical
Cantilever:
F 320 kHz
C 40 N/m
L 120 µm
*nominal values
The SEMI standard for depth control measurements: 30 nm round post amorphous CNT with a controlled length  of 500 nm and 3° tilt compensation.
Al reflex

Whisker(s):

  • HDC
  • 500 nm (400 - 600 nm)*
  • 30 nm (30 - 35 nm)*
  • <5 nm (<7 nm)*
  • (±0.5°)*
  • * guaranteed

    AFM Tip:

  • AFM Cantilever:

  • Beam
  • 120 µm (115 - 125 µm)**
  • 30 µm (28 - 32 µm)**
  • 4.4 µm (3.9 - 4.9 µm)**
  • 40 N/m (20 - 60 N/m)**
  • 320 kHz (270 - 370 kHz)**
  • ** guaranteed range

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