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AFM Probes » PPP-SEIHR
Order Code
Price
Quantity
PPP-SEIHR-10
Box of 10 AFM Probes
320
$320.00
PPP-SEIHR-W
Box of 380 AFM Probes
6409
$6 409.00
380 pcs.
You save 5751.00 USD or 47.30% with this box
Product availability:
On stock
PPP-SEIHR
Special Tapping Mode AFM Probe
Coating: Reflex Aluminum
Tip shape: Standard
Tip shape: Standard
Cantilever:
F 130 kHz
C 15 N/m
L 225 µm
- Non-Contact / Soft Tapping Mode AFM Probes
Applications
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.
For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIHR AFM probes (Seiko Instruments / high force constant). Compared with the ZEIHR type the force constant is further reduced.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped silicon to dissipate static charge
- Al coating on detector side of cantilever
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
- compatible with PointProbe® Plus XY-Alignment Series
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.