AFM Probes » PPP-XYCONTR

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Order Code Price
Quantity
PPP-XYCONTR-10 Box of 10 AFM Probes
$320.00
PPP-XYCONTR-20 Box of 20 AFM Probes
$573.00
You save 67.00 USD or 10.50% with this box
PPP-XYCONTR-50 Box of 50 AFM Probes
$1 265.00
You save 335.00 USD or 20.90% with this box

PPP-XYCONTR

Contact Mode AFM Probe with Special Alignment System

Coating: Reflex Aluminum
Tip shape: Standard
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values
The XY-auto-alignment probes for Contact mode application with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 450 µm long cantilevers optimized for contact mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8µm is possible for all probes of the XY-alignment probes series – independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225µm.

As a matter of course, the features of the proven PointProbe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

The probe offers unique features:

  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 450 µm (440 - 460 µm)*
  • 50 µm (42.5 - 57.5 µm)*
  • 2 µm (1 - 3 µm)*
  • 0.2 N/m (0.02 - 0.77 N/m)*
  • 13 kHz (6 - 21 kHz)*
  • * guaranteed range This product features alignment grooves on the back side of the holder chip.

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