AFM Probes » Q-Cond-E

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Q-Cond-E-10 Box of 10 AFM Probes
$375.00

Q-Cond-E

Premounted Electrical, Contact Mode AFM Probe, for Quesant/Ambios AFM systems

Coating: Electrically Conductive
Tip shape: Rotated
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as:

  • scanning capacitance microscopy (SCM)
  • scanning probe lithography

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriCont-G AFM probe.

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 450 µm (440 - 460 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm (1 - 3 µm)*
  • 0.2 N/m (0.07 - 0.4 N/m)*
  • 13 kHz (9 - 17 kHz)*
  • * typical range

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