AFM Probes » Q-WM190-SSS

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Q-WM190-SSS-10 Box of 10 AFM Probes
$850.00
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Q-WM190-SSS

Premounted, SuperSharp Tapping Mode AFM Probe with Long Cantilever, for Quesant/Ambios AFM systems

Coating: Reflex Aluminum
Tip shape: Supersharp
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

NANOSENSORS™ SSS-NCLR probes are designed for non-contact mode or tapping mode AFM. They are offered as an alternative to the NANOSENSORS™ high frequency non contact type (NCH). The SSS-NCLR  is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:
  • excellent tip radius of curvature
  • typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • highly doped silicon to dissipate static charge
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a NANOSENSORS SSS-NCLR AFM probe.
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (215 - 235 µm)*
  • 38 µm (30 - 45 µm)*
  • 7 µm (6 - 8 µm)*
  • 48 N/m (21 - 98 N/m)*
  • 190 kHz (146 - 236 kHz)*
  • * guaranteed range

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