AFM Probes » SEIHR

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Order Code Price
Quantity
SEIHR-10 Box of 10 AFM Probes
$307.00
SEIHR-20 Box of 20 AFM Probes
$550.00
You save 64.00 USD or 10.40% with this box
SEIHR-50 Box of 50 AFM Probes
$1 215.00
You save 320.00 USD or 20.80% with this box
SEIHR-W Box of 380 AFM Probes
$6 239.00
You save 5427.00 USD or 46.50% with this box

SEIHR

Special Tapping Mode AFM Probe

Coating: Reflex Aluminum
Tip shape: Standard
Cantilever:
F 130 kHz
C 15 N/m
L 225 µm
*nominal values
NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.
Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (220 - 230 µm)*
  • 33 µm (27.5 - 37.5 µm)*
  • 5 µm (4.5 - 5.5 µm)*
  • 15 N/m (9 - 25 N/m)*
  • 130 kHz (110 - 150 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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