AFM Probes » TESP-SS

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Order Code Price
Quantity
TESP-SS-10 Box of 10 AFM Probes
$699.00
TESP-SS-50 Box of 50 AFM Probes
$2 762.00
You save 733.00 USD or 21.00% with this box
TESP-SS-380 Box of 380 AFM Probes
$13 995.00
You save 12567.00 USD or 47.30% with this box

TESP-SS

SuperSharp, Tapping Mode AFM Probe

Coating: None
Tip shape: Supersharp
Cantilever:
F 320 kHz
C 42 N/m
L 125 µm
*nominal values

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

This probe offers unique features:

  • excellent tip radius of curvature
  • guaranteed tip radius of curvature 5 nm (yield >80%)

 
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm (3.5 - 4.5 µm)*
  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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