AFM Probes » TESP

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Order Code Price
Quantity
TESP-10 Box of 10 AFM Probes
$279.00
TESP-20 Box of 20 AFM Probes
$500.00
You save 58.00 USD or 10.40% with this box
TESP-50 Box of 50 AFM Probes
$1 104.00
You save 291.00 USD or 20.90% with this box
TESP-W Box of 380 AFM Probes
$5 672.00
You save 4930.00 USD or 46.50% with this box

TESP

Standard Tapping Mode AFM Probe

Coating: None
Tip shape: Standard
Cantilever:
F 320 kHz
C 42 N/m
L 125 µm
*nominal values

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
 
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm (3.5 - 4.5 µm)*
  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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