AFM Probes » TESPA

 Order  Request a quote (RFQ)
Order Code Price
Quantity
TESPA-10 Box of 10 AFM Probes
$307.00
TESPA-50 Box of 50 AFM Probes
$1 215.00
You save 320.00 USD or 20.80% with this box
TESPA-W Box of 380 AFM Probes
$6 239.00
You save 5427.00 USD or 46.50% with this box

TESPA

Standard Tapping Mode AFM Probe

Coating: Reflex Aluminum
Tip shape: Standard
Cantilever:
F 320 kHz
C 42 N/m
L 125 µm
*nominal values

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
 
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm (120 - 130 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm (3.5 - 4.5 µm)*
  • 42 N/m (21 - 78 N/m)*
  • 320 kHz (250 - 390 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

    Give us your feedback

    Did we miss any relevant information of this product?
    Did you find this or a comparable product for a better price?