AFM Probes » HQ:CSC17/Hard/Al BS

HQ:CSC17/Hard/Al BS

Long Scanning, DLC Hardened Contact Mode AFM Probe

Coating: Hard Diamond-Like-Carbon
Tip shape: Rotated
Cantilever:
F 13 kHz
C 0.18 N/m
L 450 µm
*nominal values
Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.
Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 450 µm
  • 50 µm
  • 2 µm
  • 0.18 N/m (0.06 - 0.4 N/m)*
  • 13 kHz (10 - 17 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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