AFM Probes » HQ:CSC17/Pt

HQ:CSC17/Pt

Electrical, Contact Mode AFM Probe

Coating: Electrically Conductive
Tip shape: Rotated
Cantilever:
F 13 kHz
C 0.18 N/m
L 450 µm
*nominal values
Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.
The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 450 µm
  • 50 µm
  • 2 µm
  • 0.18 N/m (0.06 - 0.4 N/m)*
  • 13 kHz (10 - 17 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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