AFM Probes » HQ:DPE-XSC11

HQ:DPE-XSC11

AFM Probe with 4 Different Electrical Cantilevers

Coating: Electrically Conductive
Tip shape: Rotated
This probe features 4 cantilevers
F 15 kHz
C 0.2 N/m
L 500 µm
F 80 kHz
C 2.7 N/m
L 210 µm
F 155 kHz
C 7 N/m
L 150 µm
F 350 kHz
C 42 N/m
L 100 µm
*nominal values
Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.

The DPE probes have a special structure of conducting layers applied to the tip that provides better signal to noise ratio on the scans of electric properties. The coating thickness is increased, which gives more freedom for using them in contact electrical modes. The probes provide better performance and higher contrast of electrical signals, while the ability to resolve the small surface details might be reduced. The probes can be used in electric AC modes when a study of the electric properties of a sample has higher priority.
The conducting Pt coating covers the entire Silicon chip, cantilevers and tips. It provides high conductivity and enhances the laser reflectivity.

AFM Tip:

  • Rotated
  • 15 µm (12 - 18 µm)*
  • < 40 nm
  • 40°
  • AFM Cantilevers:

    Cantilever A
  • Beam
  • 500 µm
  • 30 µm
  • 2.7 µm
  • 0.2 N/m (0.1 - 0.4 N/m)*
  • 15 kHz (12 - 18 kHz)*
  • Cantilever B
  • Beam
  • 210 µm
  • 30 µm
  • 2.7 µm
  • 2.7 N/m (1.1 - 5.6 N/m)*
  • 80 kHz (60 - 100 kHz)*
  • Cantilever C
  • Beam
  • 150 µm
  • 30 µm
  • 2.7 µm
  • 7 N/m (3 - 16 N/m)*
  • 155 kHz (115 - 200 kHz)*
  • Cantilever D
  • Beam
  • 100 µm
  • 50 µm
  • 2.7 µm
  • 42 N/m (17 - 90 N/m)*
  • 350 kHz (250 - 465 kHz)*
  • * typical range

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