AFM Probes » HQ:NSC14/No Al

HQ:NSC14/No Al

Soft Tapping Mode AFM Probe

Coating: None
Tip shape: Rotated
Cantilever:
F 160 kHz
C 5 N/m
L 125 µm
*nominal values
Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.
Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm
  • 25 µm
  • 2.1 µm
  • 5 N/m (1.8 - 13 N/m)*
  • 160 kHz (110 - 220 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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