AFM Probes » HQ:NSC14/Pt

HQ:NSC14/Pt

Electrical, Soft Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip shape: Rotated
Cantilever:
F 160 kHz
C 5 N/m
L 125 µm
*nominal values
Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.
The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm
  • 25 µm
  • 2.1 µm
  • 5 N/m (1.8 - 13 N/m)*
  • 160 kHz (110 - 220 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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