AFM Probes » HQ:NSC15/Al BS

HQ:NSC15/Al BS

Standard Tapping Mode AFM Probe

best bang for your buck

Coating: Reflex Aluminum
Tip shape: Rotated
Cantilever:
F 325 kHz
C 40 N/m
L 125 µm
*nominal values
Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when the high topographic and phase contrast are necessary. The 15 series is also good for non-contact mode.
Backside Al coated. Coating thickness - 30 nm.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm
  • 30 µm
  • 4 µm
  • 40 N/m (20 - 80 N/m)*
  • 325 kHz (265 - 410 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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