AFM Probes » HQ:NSC15/Pt

HQ:NSC15/Pt

Electrical, Tapping Mode AFM Probe

Coating: Electrically Conductive
Tip shape: Rotated
Cantilever:
F 325 kHz
C 40 N/m
L 125 µm
*nominal values
Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when the high topographic and phase contrast are necessary. The 15 series is also good for non-contact mode.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.
The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 125 µm
  • 30 µm
  • 4 µm
  • 40 N/m (20 - 80 N/m)*
  • 325 kHz (265 - 410 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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