AFM Probes » HQ:NSC18/No Al

HQ:NSC18/No Al

Standard Force Modulation AFM Probe

Coating: None
Tip shape: Rotated
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values
Cantilevers of the 18 series are optimal for the Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in Force modulation mode and the true topography imaging of the soft samples.
Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm
  • 27.5 µm
  • 3 µm
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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